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X-RAY DIFFRACTION
Materials and Methods page
1PTQ
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 32.4 α = 90
    b = 63.5 β = 90
    c = 65.5 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS II
    Collection Date 1994-09-05
    Detector IMAGE PLATE
    Type FUJI
    Collection Date 1994-10-29
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
    Diffraction Protocol MAD
     
    Diffraction Source
    Source ROTATING ANODE
    Wavelength List 1.5418
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4A
    Wavelength List 1.2826,1.2818,1.2613
    Site NSLS
    Beamline X4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.95
    Resolution(Low) 20
    Number Reflections(Observed) 4073
    Percent Possible(Observed) 89.0
    R Merge I(Observed) 0.06
    Redundancy 8.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.95
    Resolution(Low) 6.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 4073
    R-Factor(Observed) 0.196
    R-Work 0.196
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_angle_deg 2.9
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 402
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1