X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.4 α = 90
b = 63.5 β = 90
c = 65.5 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS II -- 1994-09-05
IMAGE PLATE FUJI -- 1994-10-29
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE -- 1.5418 -- --
SYNCHROTRON NSLS BEAMLINE X4A 1.2826,1.2818,1.2613 NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 20 89.0 0.06 -- -- 8.0 -- 4073 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.95 6.0 -- 0.0 -- 4073 -- -- -- 0.196 0.196 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 16.3
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 2.9
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 402
Nucleic Acid Atoms 0
Heterogen Atoms 2
Solvent Atoms 0

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building