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X-RAY DIFFRACTION
Materials and Methods page
1PTH
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 99.57 α = 90
    b = 209.8 β = 90
    c = 235 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Collection Date 1993-06
     
    Diffraction Radiation
     
    Diffraction Source
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 3.4
    Resolution(Low) 15
    Number Reflections(Observed) 27154
    Percent Possible(Observed) 82.0
    R Merge I(Observed) 0.095
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 3.4
    Resolution(Low) 8.0
    Cut-off Sigma(F) 1.0
    Number of Reflections(Observed) 23789
    Percent Reflections(Observed) 75.5
    R-Factor(Observed) 0.186
    R-Work 0.186
    R-Free 0.227
     
    Temperature Factor Modeling
    Mean Isotropic B Value 21.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.69
    x_bond_d 0.013
    x_angle_deg 1.89
    x_dihedral_angle_d 23.7
     
    Coordinate Error
    Luzzati ESD(Observed) 0.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8962
    Nucleic Acid Atoms 0
    Heterogen Atoms 258
    Solvent Atoms 1
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MADNES
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data collection MADNES