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X-RAY DIFFRACTION
Materials and Methods page
1PDR
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 110.97 α = 90
    b = 110.97 β = 90
    c = 62.47 γ = 120
     
    Space Group
    Space Group Name:    P 63 2 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
    Collection Date 1996-04-12
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Number Reflections(Observed) 5911
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.108
    Redundancy 13.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.8
    Resolution(Low) 10.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 5793
    R-Factor(Observed) 0.22
    R-Work 0.22
    R-Free 0.271
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.7
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 719
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 8
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1