ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Concentration (mg/ml) 5.0
Sample pH 7.0
Sample Support Details holey carbon
Sample Vitrification Details ethane vitrification
Sample Aggregation State PARTICLE
Name of Sample T4 baseplate-tail tube complex
Sample Details T4 double mutant, 18-,23-, produces baseplate-tail tube assemblies
EM Data Acquisition
Date of Experiment 2001-01-30
Num of Micrographs-Images Used --
Temperature (Kelvin) 70.0
Microscope Model FEI/PHILIPS CM300FEG/T
Detector Type KODAK SO163 FILM
Minimum Defocus (nm) 1200.0
Maximum Defocus (nm) 5000.0
Minimum Tilt Angle (degrees) 0.0
Maximum Tilt Angle (degrees) 0.0
Nominal CS 2.0
Imaging Mode BRIGHT FIELD
Electron Dose (electrons nm**-2) 25.0
Illumination Mode FLOOD BEAM
Nominal Magnification 45000
Calibrated Magnification 47000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s)
Reconstruction Method model-based projection matching
EM Image Reconstruction Statistics
Number of Particles 945
Nominal Pixel Size 3.11
Actual Pixel Size 2.98
Effective Resolution 12.0
CTF Correction Method CTF correction of individual particles with Wiener filtering
EM Reconstruction Magnification Callibration TMV particles images
Other Details modifed version of program SPIDER was used for the reconstruction
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL Laplacian transform real space Correlation Coefficient maximization -- -- situs 2.0/colores