X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.2 α = 90
b = 42.2 β = 90
c = 52.4 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS -- 1994-05-17
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 15 94.0 0.045 -- -- 2.8 -- 6562 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.8 15.0 -- 0.0 -- 6562 -- 94.0 -- 0.17 0.17 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 2.7
x_dihedral_angle_d 25.5
x_improper_angle_d 2.5
x_bond_d 0.02
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 647
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 60

Software

Software
Software Name Purpose
SHELXL-93 model building
X-PLOR model building version: 3.1
SHELXL-93 refinement
X-PLOR refinement version: 3.1
XENGEN data reduction
SHELXL-93 phasing
X-PLOR phasing version: 3.1