X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.4
Temperature 293.0
Details PEG 400, Hepes, MgCl2, NaCl, Imidazole, Glycerol, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.79 α = 90
b = 48.59 β = 107.78
c = 56.48 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 150
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2003-04-25
Diffraction Radiation
Monochromator Protocol
sagitally focused Si(111) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97954, 0.97940, 0.95667 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 17.93 92.6 -- -- -- -- 29950 27732 0.0 0.0 16.8

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.4 17.93 0.0 0.0 29901 27732 1389 92.7 0.1924 0.1924 0.192 0.202 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 1.46 2480 110 2370 0.253 0.269 0.026 66.5
X Ray Diffraction 1.46 1.54 3365 166 3199 0.219 0.224 0.017 90.4
X Ray Diffraction 1.54 1.64 3705 206 3499 0.204 0.227 0.016 99.7
X Ray Diffraction 1.64 1.76 3707 170 3537 0.196 0.221 0.017 99.7
X Ray Diffraction 1.76 1.94 3749 185 3564 0.188 0.184 0.014 99.8
X Ray Diffraction 1.94 2.22 3709 183 3526 0.18 0.177 0.013 99.6
X Ray Diffraction 2.22 2.8 3729 199 3530 0.18 0.204 0.014 99.4
X Ray Diffraction 2.8 17.93 3288 170 3118 0.196 0.203 0.016 85.8
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 21.78
Anisotropic B[1][1] 0.99
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.56
Anisotropic B[2][2] 1.54
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.53
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 0.95
x_torsion_deg 22.7
x_angle_deg 1.4
x_bond_d 0.009
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.14
Luzzati Sigma A (Observed) 0.1
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.15
Luzzati Sigma A (R-Free Set) 0.12
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 933
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 297

Software

Computing
Computing Package Purpose
DTCOLLECT, HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SHARP Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement