X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 298.0
Details SODIUM ACETATE, ISO-PROPANOL, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 19.01 α = 90
b = 23.18 β = 98.56
c = 30.72 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 283
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2002-03-12
Diffraction Radiation
Monochromator Protocol
Silicon (111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-18B 1.0 Photon Factory BL-18B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.84 100 86.8 0.051 -- -- 3.4 22113 22113 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
0.84 0.87 70.4 0.14 -- 8.5 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO PHASING 0.84 100.0 0.0 0.0 22113 -- 885 86.8 0.0684 0.0684 0.0684 0.0794 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 0.84 0.87 1624 -- -- 0.105 -- -- 67.41
X Ray Diffraction 0.87 0.9 1491 -- -- 0.089 -- -- 70.76
X Ray Diffraction 0.9 1.0 4064 -- -- 0.066 -- -- 76.2
X Ray Diffraction 1.0 1.2 5159 -- -- 0.052 -- -- 85.44
X Ray Diffraction 1.2 1.5 3819 -- -- 0.05 -- -- 93.76
X Ray Diffraction 1.5 30.0 4105 -- -- 0.077 -- -- 94.37
RMS Deviations
Key Refinement Restraint Deviation
s_similar_adp_cmpnt 0.032
s_non_zero_chiral_vol 0.142
s_bond_d 0.017
s_zero_chiral_vol 0.15
s_anti_bump_dis_restr 0.0
s_similar_dist 0.0
s_from_restr_planes 0.0329
s_angle_d 0.035
s_rigid_bond_adp_cmpnt 0.008
s_approx_iso_adps 0.0
Coordinate Error
Parameter Value
Number Disordered Residues 7.0
Occupancy Sum Hydrogen 249.0
Occupancy Sum Non Hydrogen 345.5
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 585
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 64

Software

Software
Software Name Purpose
SHELX model building
SHELXL-97 refinement
DENZO data reduction
SCALEPACK data scaling
SnB phasing