X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 295.0
Details Tris-HCl, sodium acetate, PEG 3350, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 60.45 α = 90
b = 60.45 β = 90
c = 102.36 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 119
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV mirrors 2002-08-02
Diffraction Radiation
Monochromator Protocol
Yale mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 50 99.4 0.054 0.064 -- 9.5 9526 9467 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.33 89.8 0.54 0.599 2.39 4.7 924

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.25 50.0 -- 0.0 9526 9467 505 94.1 -- -- 0.249 0.286 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.25 2.33 877 47 -- 0.3157 0.3409 -- 9.26
X Ray Diffraction 2.33 2.42 870 51 -- 0.3024 0.2771 -- 9.19
X Ray Diffraction 2.42 2.53 890 33 -- 0.3084 0.3437 -- 9.4
X Ray Diffraction 2.53 2.67 880 50 -- 0.3046 0.3358 -- 9.28
X Ray Diffraction 2.67 2.83 879 53 -- 0.2909 0.3276 -- 9.28
X Ray Diffraction 2.83 3.05 904 47 -- 0.2564 0.2628 -- 9.55
X Ray Diffraction 3.05 3.36 896 49 -- 0.2738 0.3294 -- 9.46
X Ray Diffraction 3.36 3.85 897 60 -- 0.2451 0.2724 -- 9.48
X Ray Diffraction 3.85 4.85 917 57 -- 0.2086 0.2676 -- 9.68
X Ray Diffraction 4.85 50.0 952 58 -- 0.234 0.3004 -- 10.05
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 50.74
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.011
c_angle_deg 1.402
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.28
Luzzati Sigma A (Observed) 0.27
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.33
Luzzati Sigma A (R-Free Set) 0.31
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1578
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 52

Software

Software
Software Name Purpose
HKL-2000 data collection
SCALEPACK data scaling
CNS refinement
HKL-2000 data reduction
CNS phasing