X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 298.0
Details tris-HCl, sodium acetate, PEG 3350, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.03 α = 90
b = 63.03 β = 90
c = 101.11 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 119
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2002-07-17
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 -- ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 50 96.9 0.035 0.034 -- 9.6 21237 20581 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.75 1.81 97.8 0.541 0.556 4.6 4.9 1922

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.75 50.0 -- 0.0 21237 20581 999 92.2 -- -- 0.252 0.287 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.81 1922 108 -- 0.2833 0.2965 -- 9.43
X Ray Diffraction 1.81 1.89 1963 97 -- 0.2602 0.2894 -- 9.52
X Ray Diffraction 1.89 1.97 1987 99 -- 0.271 0.3115 -- 9.65
X Ray Diffraction 1.97 2.07 1960 98 -- 0.2568 0.2699 -- 9.52
X Ray Diffraction 2.07 2.2 2002 90 -- 0.2582 0.3334 -- 9.73
X Ray Diffraction 2.2 2.38 1995 103 -- 0.2472 0.2336 -- 9.69
X Ray Diffraction 2.38 2.61 2007 97 -- 0.2473 0.2645 -- 9.75
X Ray Diffraction 2.61 2.99 2011 107 -- 0.2626 0.3254 -- 9.77
X Ray Diffraction 2.99 3.77 1940 97 -- 0.2412 0.2823 -- 9.43
X Ray Diffraction 3.77 50.0 1795 103 -- 0.247 0.2839 -- 8.72
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 26.28
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.323
c_bond_d 0.009
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.27
Luzzati Sigma A (Observed) 0.26
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.34
Luzzati Sigma A (R-Free Set) 0.32
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1578
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 213

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
CNS Structure Solution
CNS 1.0 Structure Refinement
Software
Software Name Purpose
CNS version: 1.0 refinement
CNS model building
SCALEPACK data reduction
HKL-2000 data collection