X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 291.0
Details 2.8M Sodium Formate, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 113.37 α = 90
b = 113.37 β = 90
c = 79.88 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2003-03-28
IMAGE PLATE RIGAKU RAXIS IV -- 2003-04-01
Diffraction Radiation
Monochromator Protocol
OSMIC MULTILAYER SINGLE WAVELENGTH
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.9790 NSLS X4A
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 20 99.6 0.082 -- -- -- 94669 94669 0.0 0.0 18.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.55 97.9 0.358 -- 2.5 4.0 9229

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIR 1.5 19.64 -- 0.0 92422 92422 4651 97.5 0.2011 0.2011 0.201 0.213 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.55 -- 440 8350 0.29 0.288 0.014 93.6
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 23.0
Anisotropic B[1][1] -1.66
Anisotropic B[1][2] -1.59
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.66
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.31
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.005
c_scbond_it 0.77
c_mcangle_it 0.85
c_angle_deg 1.2
c_dihedral_angle_d 23.1
c_mcbond_it 0.48
c_scangle_it 1.25
c_improper_angle_d 0.81
Coordinate Error
Parameter Value
Luzzati ESD (R-Free Set) 0.2
Luzzati Sigma A (R-Free Set) 0.17
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3209
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 521

Software

Software
Software Name Purpose
DENZO data reduction
SCALEPACK data scaling
SOLVE phasing
RESOLVE model building
CNS refinement version: 0.9
RESOLVE phasing