X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 291.0
Details 2.8M Sodium Formate, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 113.37 α = 90
b = 113.37 β = 90
c = 79.88 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV -- 2003-04-01
CCD ADSC QUANTUM 4 -- 2003-03-28
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
OSMIC MULTILAYER SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 -- --
SYNCHROTRON NSLS BEAMLINE X4A 0.9790 NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 20 99.6 0.082 -- -- -- 94669 94669 0.0 0.0 18.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.55 97.9 0.358 -- 2.5 4.0 9229

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIR 1.5 19.64 -- 0.0 92422 92422 4651 97.5 0.2011 0.2011 0.201 0.213 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.55 -- 440 8350 0.29 0.288 0.014 93.6
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 23.0
Anisotropic B[1][1] -1.66
Anisotropic B[1][2] -1.59
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.66
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.31
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.005
c_dihedral_angle_d 23.1
c_improper_angle_d 0.81
c_mcangle_it 0.85
c_angle_deg 1.2
c_mcbond_it 0.48
c_scbond_it 0.77
c_scangle_it 1.25
Coordinate Error
Parameter Value
Luzzati ESD (R-Free Set) 0.2
Luzzati Sigma A (R-Free Set) 0.17
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3209
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 521

Software

Software
Software Name Purpose
DENZO data reduction
SCALEPACK data scaling
SOLVE phasing
RESOLVE model building
CNS refinement version: 0.9
RESOLVE phasing