X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 301.0
Details ammonium sulphate, 1-6 hexane diol, HEPES, water, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 301K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.68 α = 90
b = 54.5 β = 98.81
c = 70.92 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 119
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2002-10-17
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.000 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 50 99.6 0.053 0.047 -- 9.9 67651 67411 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.55 1.61 99.6 0.053 0.047 2.14 5.2 6354

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.55 50.0 -- 0.0 67651 67411 3434 94.6 -- -- 0.212 0.237 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.55 1.61 6354 357 -- 0.2942 0.2898 -- 9.43
X Ray Diffraction 1.61 1.67 6380 337 -- 0.2769 0.3046 -- 9.46
X Ray Diffraction 1.67 1.75 6374 344 -- 0.2637 0.3064 -- 9.46
X Ray Diffraction 1.75 1.84 6385 334 -- 0.2588 0.273 -- 9.47
X Ray Diffraction 1.84 1.95 6394 352 -- 0.2487 0.2733 -- 9.49
X Ray Diffraction 1.95 2.1 6377 367 -- 0.2353 0.2656 -- 9.46
X Ray Diffraction 2.1 2.32 6430 318 -- 0.2252 0.2614 -- 9.54
X Ray Diffraction 2.32 2.65 6453 336 -- 0.2176 0.2462 -- 9.57
X Ray Diffraction 2.65 3.34 6415 373 -- 0.2045 0.2279 -- 9.52
X Ray Diffraction 3.34 50.0 6415 316 -- 0.1911 0.2119 -- 9.52
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.1
c_bond_d 0.005
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.24
Luzzati Sigma A (Observed) 0.21
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.34
Luzzati Sigma A (R-Free Set) 0.3
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3490
Nucleic Acid Atoms 0
Heterogen Atoms 88
Solvent Atoms 438

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
CNS Structure Solution
CNS 1.0 Structure Refinement
Software
Software Name Purpose
CNS version: 1.0 refinement
CNS model building
SCALEPACK data reduction
HKL-2000 data collection