X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 301.0
Details ammonium sulphate, 1,6-hexanediol, HEPES, water, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 301K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.85 α = 90
b = 54.65 β = 99.28
c = 72.14 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 119
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2002-10-17
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 1.000 ALS 5.0.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.74 50 99.8 0.066 0.055 -- 9.9 48986 48906 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.74 1.8 89.9 0.038 0.046 2.12 4.8 4570

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.74 50.0 -- 0.0 48986 48906 2452 99.8 -- -- 0.209 0.232 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.74 1.8 4570 243 -- 0.3192 0.3297 -- 9.34
X Ray Diffraction 1.8 1.87 4638 251 -- 0.2814 0.309 -- 9.48
X Ray Diffraction 1.87 1.96 4593 250 -- 0.2544 0.2858 -- 9.39
X Ray Diffraction 1.96 2.06 4638 239 -- 0.242 0.2809 -- 9.48
X Ray Diffraction 2.06 2.19 4717 250 -- 0.2373 0.2683 -- 9.65
X Ray Diffraction 2.19 2.36 4671 215 -- 0.2171 0.2436 -- 9.55
X Ray Diffraction 2.36 2.6 4648 232 -- 0.2113 0.2465 -- 9.5
X Ray Diffraction 2.6 2.98 4656 252 -- 0.2207 0.2401 -- 9.52
X Ray Diffraction 2.98 3.75 4665 265 -- 0.1905 0.2084 -- 9.54
X Ray Diffraction 3.75 50.0 4758 255 -- 0.1811 0.2008 -- 9.72
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.006
c_angle_deg 1.2
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.255
Luzzati Sigma A (Observed) 0.228
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.33
Luzzati Sigma A (R-Free Set) 0.29
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3490
Nucleic Acid Atoms 0
Heterogen Atoms 86
Solvent Atoms 350

Software

Software
Software Name Purpose
HKL-2000 data collection
SCALEPACK data scaling
CNS refinement
HKL-2000 data reduction
CNS phasing