X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 301.0
Details ammomium sulphate, 1,6 hexanediol, HEPES, water, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 301K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.66 α = 90
b = 54.37 β = 99.82
c = 71.75 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 119
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV mirrors 2002-11-28
Diffraction Radiation
Monochromator Protocol
yale mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.19 50 98.9 0.105 0.091 -- 7.4 24350 24079 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.19 2.27 94.1 0.099 0.089 2.29 4.39 2151

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.19 50.0 -- 0.0 24350 24079 1163 98.9 -- -- 0.209 0.26 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.19 2.27 2151 115 -- 0.2656 0.3457 -- 8.93
X Ray Diffraction 2.27 2.36 2272 111 -- 0.2498 0.3029 -- 9.44
X Ray Diffraction 2.36 2.47 2296 99 -- 0.2493 0.3207 -- 9.54
X Ray Diffraction 2.47 2.6 2279 121 -- 0.2348 0.2873 -- 9.47
X Ray Diffraction 2.6 2.76 2335 97 -- 0.2172 0.3019 -- 9.7
X Ray Diffraction 2.76 2.97 2297 117 -- 0.205 0.2769 -- 9.54
X Ray Diffraction 2.97 3.27 2296 133 -- 0.2184 0.2555 -- 9.54
X Ray Diffraction 3.27 3.74 2323 128 -- 0.1988 0.2611 -- 9.65
X Ray Diffraction 3.74 4.72 2310 115 -- 0.17 0.2297 -- 9.59
X Ray Diffraction 4.72 50.0 2357 127 -- 0.2105 0.2285 -- 9.79
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.2
c_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3484
Nucleic Acid Atoms 0
Heterogen Atoms 86
Solvent Atoms 214

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
CNS Structure Solution
CNS Structure Refinement
Software
Software Name Purpose
CNS refinement
CNS model building
SCALEPACK data reduction
HKL-2000 data collection