X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 301.0
Details ammomium sulphate, 1,6 hexane-diol, HEPES, water, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 301K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.67 α = 90
b = 77.66 β = 90
c = 100.32 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 119
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV mirrors 2002-04-18
Diffraction Radiation
Monochromator Protocol
yale mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.59 50 98.7 0.071 0.066 -- 8.1 33028 14071 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.59 50.0 -- 0.0 14071 14071 -- 97.8 0.23351 0.23351 0.2335 0.3087 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.59 2.68 1309 53 -- 0.3351 0.4565 -- 9.3
X Ray Diffraction 2.68 2.79 1326 66 -- 0.301 0.3712 -- 9.42
X Ray Diffraction 2.79 2.92 1292 74 -- 0.2714 0.3977 -- 9.18
X Ray Diffraction 2.92 3.07 1315 73 -- 0.2727 0.3086 -- 9.35
X Ray Diffraction 3.07 3.26 1313 72 -- 0.2671 0.3695 -- 9.33
X Ray Diffraction 3.26 3.51 1325 70 -- 0.2556 0.313 -- 9.42
X Ray Diffraction 3.51 3.87 1082 53 -- 0.284 0.4268 -- 7.69
X Ray Diffraction 3.87 4.43 1338 68 -- 0.1877 0.2926 -- 9.51
X Ray Diffraction 4.43 5.58 1371 81 -- 0.2055 0.2589 -- 9.74
X Ray Diffraction 5.58 50.0 1413 85 -- 0.1994 0.2491 -- 10.04
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.008
c_angle_deg_ 1.3
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.52
Luzzati Sigma A (Observed) 0.36
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.41
Luzzati Sigma A (R-Free Set) 0.32
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3484
Nucleic Acid Atoms 0
Heterogen Atoms 86
Solvent Atoms 99

Software

Software
Software Name Purpose
HKL-2000 data collection
SCALEPACK data scaling
AMoRE phasing
CNS refinement version: 1.0
HKL-2000 data reduction