X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.16 α = 90
b = 79.67 β = 90
c = 99.48 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 -- 91.0 0.0538 -- -- -- -- 23771 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.1 10.0 -- 0.0 -- -- -- -- -- 0.196 0.196 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 1.342
x_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3139
Nucleic Acid Atoms 0
Heterogen Atoms 70
Solvent Atoms 241

Software

Software
Software Name Purpose
X-PLOR model building
X-PLOR refinement
XENGEN data reduction
SDMS data reduction
X-PLOR phasing