X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5
Temperature 288.0
Details ammonium sulfate, lithium sulfate, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 288K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 84.38 α = 90
b = 78.95 β = 92.96
c = 148.82 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- --
Diffraction Radiation
Monochromator Protocol
mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS FR591 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.07 20 93.9 -- 0.1 -- 2.8 111939 111939 -- -3.0 23.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.07 2.2 83.6 -- 0.232 4.5 2.2 36071

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.07 20.0 -- 0.0 111938 111938 4876 94.32 0.16307 0.16307 0.16081 0.21171 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.07 2.125 -- 154 6430 0.232 0.272 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 9.895
Anisotropic B[1][1] -1.87
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.01
Anisotropic B[2][2] -0.52
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 2.39
RMS Deviations
Key Refinement Restraint Deviation
r_nbd_refined 0.208
r_symmetry_vdw_refined 0.129
r_symmetry_vdw_other 0.275
r_gen_planes_refined 0.006
r_mcangle_it 2.656
r_dihedral_angle_1_deg 6.297
r_xyhbond_nbd_refined 0.206
r_bond_refined_d 0.014
r_mcbond_it 1.935
r_nbtor_other 0.087
r_angle_refined_deg 1.432
r_angle_other_deg 0.836
r_nbd_other 0.244
r_scangle_it 4.134
r_chiral_restr 0.088
r_symmetry_hbond_refined 0.213
r_gen_planes_other 0.004
r_bond_other_d 0.002
r_scbond_it 2.854
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11336
Nucleic Acid Atoms 0
Heterogen Atoms 74
Solvent Atoms 1557

Software

Software
Software Name Purpose
XDS data scaling
XDS data reduction
REFMAC refinement