X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 70.6 α = 90
b = 114.7 β = 90
c = 118.5 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 180 mm plate -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 30 96.74 0.157 -- -- 3.1 -- 41389 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.3 8.0 -- 0.0 -- 37212 -- 90.0 -- 0.176 0.176 0.222 --
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 2.29
x_improper_angle_d 1.53
x_bond_d 0.024
x_dihedral_angle_d 24.79
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.18
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3907
Nucleic Acid Atoms 0
Heterogen Atoms 79
Solvent Atoms 403

Software

Software
Software Name Purpose
XDS data scaling
X-PLOR model building version: 3.1
X-PLOR refinement version: 3.1
XDS data reduction
X-PLOR phasing version: 3.1