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X-RAY DIFFRACTION
Materials and Methods page
1OPM
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Details pH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.4 α = 90
    b = 68.84 β = 90
    c = 81.05 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV
    Details SPHERICAL RH COATED MIRROR
    Collection Date 1998-01-01
     
    Diffraction Radiation
    Monochromator SAGITTALLY FOCUSED SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4A
    Wavelength 1.0093
    Site NSLS
    Beamline X4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.1
    Resolution(Low) 20
    Number Reflections(Observed) 22493
    Percent Possible(Observed) 96.6
    Redundancy 4.6
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.175
    Percent Possible(All) 98.7
    Mean I Over Sigma(Observed) 3.9
    R-Sym I(Observed) 0.358
    Redundancy 4.55
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 10.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 20238
    Number of Reflections(R-Free) 1051
    Percent Reflections(Observed) 88.0
    R-Work 0.2
    R-Free 0.259
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Anisotropic B[1][1] -4.6086
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.953
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.3444
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.16
    Number of Reflections(R-Free) 82
    Number of Reflections(R-Work) 1318
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.292
    R-Free Error 0.032
    Percent Reflections(Observed) 75.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 6.5
    x_scbond_it 4.3
    x_mcangle_it 4.6
    x_mcbond_it 2.6
    x_improper_angle_d 1.37
    x_bond_d 0.017
    x_angle_deg 1.97
    x_dihedral_angle_d 26.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2418
    Nucleic Acid Atoms 0
    Heterogen Atoms 80
    Solvent Atoms 151
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Refinement X-PLOR 3.8
     
    Software
    refinement X-PLOR version: 3.8
    data reduction SCALEPACK
    data collection DENZO