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X-RAY DIFFRACTION
Materials and Methods page
1OPH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 291.0
    Details 0.2 M tri-K-citrate, 17.5% PEG 3350, 2% GLYCEROL, pH 8.30, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 132.23 α = 90
    b = 62.32 β = 110.32
    c = 98.88 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2002-08-27
    Detector CCD
    Type MARRESEARCH
    Collection Date 2002-08-27
     
    Diffraction Radiation
    Monochromator Si 220
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator Si 220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1.0000
    Site APS
    Beamline 22-ID
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1.0000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 40
    Number Reflections(All) 32771
    Number Reflections(Observed) 32771
    Percent Possible(Observed) 97.5
    R Merge I(Observed) 0.103
    B(Isotropic) From Wilson Plot 27.4
    Redundancy 19.2
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.38
    Percent Possible(All) 97.3
    R Merge I(Observed) 0.289
    Mean I Over Sigma(Observed) 3.75
    Number Unique Reflections(All) 3330
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 22.51
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 32771
    Number of Reflections(Observed) 32771
    Number of Reflections(R-Free) 3277
    Percent Reflections(Observed) 97.5
    R-Work 0.19
    R-Free 0.229
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 42.0
    Anisotropic B[1][1] -8.51
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.08
    Anisotropic B[2][2] 19.34
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.83
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.41
    Number of Reflections(Observed) 3853
    Number of Reflections(R-Free) 362
    Number of Reflections(R-Work) 4567
    R-Factor(R-Work) 0.254
    R-Factor(R-Free) 0.254
    R-Free Error 0.013
    Percent Reflections(Observed) 92.6
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 3.15
    c_scbond_it 2.17
    c_mcangle_it 2.18
    c_mcbond_it 1.33
    c_improper_angle_d 0.79
    c_dihedral_angle_d 24.3
    c_angle_deg 1.3
    c_bond_d 0.006
     
    Coordinate Error
    Luzzati ESD(Observed) 0.24
    Luzzati Sigma A(Observed) 0.26
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.31
    Luzzati Sigma A(R-Free Set) 0.31
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4542
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 377
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution CNS
    Structure Refinement CNS 1.0
     
    Software
    refinement CNS version: 1.0
    model building CNS
    data reduction SCALEPACK
    data collection DENZO