X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.6
Temperature 293.0
Details PEG 400, cadmio chloride, sodium acetate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 96.45 α = 90
b = 65.62 β = 97.4
c = 70.83 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2003-02-08
Diffraction Radiation
Monochromator Protocol
SI 111 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1.2 ELETTRA 5.2R

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.56 50 97.2 0.055 0.055 -- 3.9 60660 60660 0.0 0.0 17.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.56 1.64 89.9 0.174 0.146 7.0 3.2 7334

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.56 10.0 0.0 0.0 54369 54369 6040 87.5 0.203 0.1973 0.1973 0.2235 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.56 1.64 7045 -- -- 0.221 -- -- --
RMS Deviations
Key Refinement Restraint Deviation
s_zero_chiral_vol 0.056
s_from_restr_planes 0.028
s_non_zero_chiral_vol 0.059
s_bond_d 0.019
s_angle_d 0.02
s_approx_iso_adps 0.0
s_similar_dist 0.0
s_anti_bump_dis_restr 0.077
s_rigid_bond_adp_cmpnt 0.0
s_similar_adp_cmpnt 0.077
Coordinate Error
Parameter Value
Number Disordered Residues 0.0
Occupancy Sum Hydrogen 0.0
Occupancy Sum Non Hydrogen 3891.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3516
Nucleic Acid Atoms 0
Heterogen Atoms 2
Solvent Atoms 365

Software

Software
Software Name Purpose
SHELX model building
SHELXL-97 refinement
MOSFLM data reduction
CCP4 data scaling version: (SCALA)
AMoRE phasing