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X-RAY DIFFRACTION
Materials and Methods page
1OKL
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.7 α = 90
    b = 41.7 β = 104.6
    c = 73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
     
    Diffraction Radiation
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.1
    Percent Possible(Observed) 96.0
    Redundancy 2.2
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Percent Possible(All) 77.0
    R Merge I(Observed) 0.048
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.1
    Number of Reflections(Observed) 13351
    R-Factor(Observed) 0.185
    R-Work 0.185
    R-Free 0.233
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.3
    x_bond_d 0.007
    x_angle_deg 1.6
    x_dihedral_angle_d 25.1
     
    Coordinate Error
    Luzzati ESD(Observed) 0.25
    Luzzati Sigma A(Observed) 0.39
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2029
    Nucleic Acid Atoms 0
    Heterogen Atoms 19
    Solvent Atoms 101
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) CCP4
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1