X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.2
Temperature 277.0
Details 16% PEG1500, 4% PEG3350, 0.2M tri-sodium citrate dihydrate, pH 8.2, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 82.24 α = 90
b = 82.24 β = 90
c = 263.56 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 mirror 2003-02-10
Diffraction Radiation
Monochromator Protocol
GRAPHITE MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CHESS BEAMLINE F1 0.916, 0.9500, 0.9790, 0.9787 CHESS F1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 30 98.7 0.09 -- -- 8.5 19164 18911 -- -3.0 49.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.54 96.3 0.415 -- 2.0 5.0 881

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.5 29.51 -- 0.0 19164 18911 960 99.0 -- 0.245 0.245 0.296 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.66 2989 153 740 0.3491 0.4043 -- --
X Ray Diffraction 2.66 2.86 3089 148 -- 0.3238 0.3689 -- --
X Ray Diffraction 2.86 3.15 3134 152 -- 0.3012 0.3398 -- --
X Ray Diffraction 3.15 3.61 3151 154 -- 0.2863 0.3095 -- --
X Ray Diffraction 3.61 4.54 3213 174 -- 0.2275 0.3011 -- --
X Ray Diffraction 4.54 29.51 3335 179 -- 0.1931 0.2473 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 65.0
Anisotropic B[1][1] 7.1
Anisotropic B[1][2] 9.78
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 7.1
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -14.21
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.007
c_angle_deg 1.3
c_improper_angle_d 0.83
c_dihedral_angle_d 21.1
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.39
Luzzati Sigma A (Observed) 0.45
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.48
Luzzati Sigma A (R-Free Set) 0.46
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3056
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 107

Software

Software
Software Name Purpose
CNS refinement version: 1.1
HKL-2000 data reduction
SCALEPACK data scaling
SOLVE phasing