X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop Nanodrop
Temperature 293.0
Details 30% Ethylene Glycol, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K
Method Vapor Diffusion Sitting Drop Nanodrop
Temperature 293.0
Details 30% Ethylene Glycol , VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 107.21 α = 90
b = 107.21 β = 90
c = 134.92 γ = 120
Symmetry
Space Group P 63 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2003-04-17
CCD ADSC QUANTUM 315 -- 2003-04-17
Diffraction Radiation
Monochromator Protocol
double crystal monochromator MAD
single crystal Si(111) bent monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 -- SSRL BL11-1
SYNCHROTRON SSRL BEAMLINE BL9-2 0.979608, 0.918370, 0.979413 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 54.55 99.8 0.099 -- -- 5.1 18532 18532 -- -- 56.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.46 98.8 0.707 -- 1.8 2.6 1325

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.4 41.97 -- -- -- 17676 830 99.77 -- 0.17765 0.17542 0.22238 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4 2.462 -- 0 1323 0.245 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ISOTROPIC
Mean Isotropic B 57.277
Anisotropic B[1][1] -2.4
Anisotropic B[1][2] -1.2
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -2.4
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.61
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_2_deg 36.267
r_angle_refined_deg 1.505
r_symmetry_hbond_refined 0.164
r_scbond_it 1.706
r_scangle_it 2.603
r_symmetry_vdw_other 0.302
r_nbd_refined 0.185
r_bond_other_d 0.001
r_chiral_restr 0.093
r_dihedral_angle_3_deg 17.738
r_gen_planes_other 0.001
r_mcangle_it 1.285
r_mcbond_it 0.832
r_xyhbond_nbd_refined 0.022
r_angle_other_deg 0.832
r_bond_refined_d 0.017
r_gen_planes_refined 0.006
r_nbtor_other 0.091
r_nbd_other 0.199
r_dihedral_angle_1_deg 7.304
r_symmetry_vdw_refined 0.148
r_dihedral_angle_4_deg 17.963
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2548
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 218

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
SOLVE/RESOLVE Structure Solution
REFMAC 5.1.9999 Structure Refinement
Software
Software Name Purpose
MOSFLM data collection
SOLVE model building
RESOLVE model building
REFMAC version: 5.1.9999 refinement
SCALA data reduction