X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7
Temperature 277.0
Details 40 % (+/-)-2-Methyl-2,4-Pentanediol; 0.1 M HEPES pH 7.0, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K, pH 7.00

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.49 α = 90
b = 73.89 β = 90
c = 87.74 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 FLAT MIRROR,SINGLE CRYSTAL SI(311) BENT MONOCHROMATOR 2002-11-26
Diffraction Radiation
Monochromator Protocol
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.91837, 0.97931, 0.97892 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 29.79 99.1 -- 0.067 -- 4.7 -- 15973 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.95 93.2 -- 0.284 3.4 2.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.9 28.26 -- 0.0 -- 15168 803 100.0 -- 0.118 0.117 0.138 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 1.95 -- 60 1030 0.213 0.19 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 13.98
Anisotropic B[1][1] 1.4
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.1
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.3
RMS Deviations
Key Refinement Restraint Deviation
r_symmetry_vdw_refined 0.178
r_angle_other_deg 0.934
r_dihedral_angle_1_deg 5.529
r_chiral_restr 0.1
r_scangle_it 4.246
r_dihedral_angle_3_deg 11.572
r_xyhbond_nbd_refined 0.24
r_bond_other_d 0.006
r_angle_refined_deg 1.518
r_symmetry_hbond_refined 0.259
r_gen_planes_refined 0.008
r_symmetry_vdw_other 0.308
r_mcangle_it 1.467
r_scbond_it 2.562
r_mcbond_it 0.772
r_bond_refined_d 0.016
r_gen_planes_other 0.001
r_nbd_other 0.239
r_nbtor_other 0.084
r_nbd_refined 0.217
r_dihedral_angle_2_deg 35.571
r_dihedral_angle_4_deg 15.732
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1139
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 212

Software

Software
Software Name Purpose
MOSFLM data reduction
SCALA data scaling
RESOLVE model building
SOLVE phasing
CNS refinement
REFMAC refinement
XFIT data reduction
CCP4 data scaling version: (SCALA)
RESOLVE phasing