X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6.5
Details pH 6.50

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.09 α = 90
b = 83.22 β = 99.29
c = 53.65 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 295
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC COLLIMATOR 1999-02-15
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE SIEMENS -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 30 93.8 0.047 -- -- 2.81 -- 47581 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.9 90.1 0.218 -- 4.85 2.76 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.8 8.0 -- 0.0 46994 -- 2245 93.8 0.181 0.18 -- 0.222 RANDOM
RMS Deviations
Key Refinement Restraint Deviation
s_angle_d 0.015
s_similar_dist 0.022
s_zero_chiral_vol 0.039
s_anti_bump_dis_restr 0.01
s_bond_d 0.005
s_non_zero_chiral_vol 0.041
Coordinate Error
Parameter Value
Number Disordered Residues 4.0
Occupancy Sum Hydrogen 0.0
Occupancy Sum Non Hydrogen 4830.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4424
Nucleic Acid Atoms 0
Heterogen Atoms 172
Solvent Atoms 282

Software

Software
Software Name Purpose
XDS data scaling
XSCALE data scaling
SHELX model building
SHELXL-97 refinement
XDS data reduction
SHELX phasing