X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.2
Temperature 298.0
Details 50 mM Tris, 50 mM NaCl, 5 mM Zn2+, pH 7.2, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 50.28 α = 90
b = 50.28 β = 90
c = 94.07 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
3 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2001-09-04
CCD ADSC QUANTUM 210 -- 2002-02-15
CCD ADSC QUANTUM 4 -- 2002-04-09
Diffraction Radiation
Monochromator Protocol
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.93, 1.282, 1.284 ESRF ID29
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9393 ESRF ID14-4
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1.2 ELETTRA 5.2R

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 43.55 98.1 0.11 0.11 -- 6.2 10333 10333 0.0 0.0 40.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.95 2.06 90.9 0.33 0.33 1.2 5.3 1340

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.95 43.55 0.0 0.0 10333 10307 1062 97.8 0.229 0.227 0.227 0.268 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.95 2.07 1560 158 1379 0.382 0.387 0.031 90.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 59.2
Anisotropic B[1][1] -4.56
Anisotropic B[1][2] 2.22
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -6.75
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 11.31
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.5
c_mcbond_it 1.61
c_scbond_it 2.42
c_scangle_it 4.03
c_mcangle_it 2.84
c_bond_d 0.009
c_dihedral_angle_d 20.3
c_improper_angle_d 0.97
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.32
Luzzati Sigma A (Observed) 0.38
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.35
Luzzati Sigma A (R-Free Set) 0.39
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 876
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 73

Software

Software
Software Name Purpose
CNS refinement version: 1.0
MOSFLM data reduction
CCP4 data scaling version: (SCALA)
SOLVE phasing