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X-RAY DIFFRACTION
Materials and Methods page
1NVY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 290.0
    Details SrCl2, MPD, NaCacodylate , pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.73 α = 90
    b = 25.32 β = 110.11
    c = 36.49 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2002-05-15
     
    Diffraction Radiation
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type EMBL/DESY, HAMBURG BEAMLINE BW7A
    Wavelength List 0.9470, 0.7301, 0.7667, 0.7670
    Site EMBL/DESY, HAMBURG
    Beamline BW7A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.5
    Resolution(Low) 20
    Number Reflections(All) 16734
    Number Reflections(Observed) 16734
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.075
    B(Isotropic) From Wilson Plot 20.89
    Redundancy 1.9
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.58
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.228
    Mean I Over Sigma(Observed) 4.38
    Redundancy 1.88
    Number Unique Reflections(All) 2509
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 1.5
    Resolution(Low) 34.3
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 8443
    Number of Reflections(Observed) 8443
    Number of Reflections(R-Free) 433
    Percent Reflections(Observed) 98.92
    R-Factor(Observed) 0.20962
    R-Work 0.2069
    R-Free 0.26294
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.039
    Anisotropic B[1][1] -1.26
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.41
    Anisotropic B[2][2] 1.15
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.18
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.581
    Number of Reflections(R-Free) 51
    Number of Reflections(R-Work) 1205
    R-Factor(R-Work) 0.262
    R-Factor(R-Free) 0.31
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 5.738
    r_sphericity_free 6.942
    r_nbtor_other 0.102
    r_nbd_other 0.228
    r_nbd_refined 0.13
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.022
    r_chiral_restr 0.097
    r_angle_other_deg 1.707
    r_angle_refined_deg 2.442
    r_bond_other_d 0.002
    r_bond_refined_d 0.019
    r_xyhbond_nbd_refined 0.163
    r_metal_ion_refined 0.107
    r_symmetry_vdw_refined 0.086
    r_symmetry_vdw_other 0.351
    r_symmetry_hbond_refined 0.076
    r_scbond_it 2.883
    r_scangle_it 3.807
    r_rigid_bond_restr 2.042
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 404
    Heterogen Atoms 5
    Solvent Atoms 107
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution SOLVE
    Structure Refinement REFMAC 5.1.24
     
    Software
    refinement REFMAC version: 5.1.24