X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 288.0
Details 4%-8% (w/v) Peg 6K or 20K, 100 mM Tris-HCl (pH 8.5) , VAPOR DIFFUSION, HANGING DROP, temperature 288K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 57.74 α = 90
b = 115.84 β = 94.14
c = 61.96 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 mirrors 2000-06-07
IMAGE PLATE RIGAKU RAXIS IIC mirrors 2000-06-07
Diffraction Radiation
Monochromator Protocol
SI 111 channel SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 -- --
SYNCHROTRON NSLS BEAMLINE X9B 0.92 NSLS X9B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 20 97.9 -- -- -- -- -- 22098 2.0 2.0 41.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 20.0 91.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7 20.0 -- 0.0 -- 21302 2112 -- -- -- 0.186 0.254 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.87 2981 315 -- 0.266 0.334 0.019 9.6
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 36.1
Anisotropic B[1][1] -11.89
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.07
Anisotropic B[2][2] -1.29
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 13.18
RMS Deviations
Key Refinement Restraint Deviation
c_dihedral_angle_d 25.2
c_improper_angle_d 0.78
c_angle_d 1.3
c_bond_d 0.006
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.28
Luzzati Sigma A (Observed) 0.37
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.4
Luzzati Sigma A (R-Free Set) 0.46
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5266
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 198

Software

Software
Software Name Purpose
HKL-2000 data collection
SCALEPACK data scaling
AMoRE phasing
CNS refinement version: 1.0
HKL-2000 data reduction