X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.2
Temperature 293.0
Details PEG 400, sodium/potassium phosphate, sodium chloride, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 293.K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 53.12 α = 90
b = 68.42 β = 90
c = 95.03 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 150
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2002-12-19
Diffraction Radiation
Monochromator Protocol
sagitally focused Si(111) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97948,0.97959,0.95372 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 94.6 -- -- -- -- 38821 36714 0.0 0.0 21.1

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.7 31.45 0.0 0.0 38824 36714 1819 94.6 0.1951 -- 0.194 0.222 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.78 3492 174 3318 0.338 0.389 0.03 73.1
X Ray Diffraction 1.78 1.87 4372 206 4166 0.25 0.277 0.019 91.5
X Ray Diffraction 1.87 1.99 4623 219 4404 0.209 0.263 0.018 96.1
X Ray Diffraction 1.99 2.14 4732 222 4510 0.198 0.245 0.016 98.0
X Ray Diffraction 2.14 2.36 4751 248 4503 0.184 0.226 0.014 98.4
X Ray Diffraction 2.36 2.7 4816 243 4573 0.184 0.218 0.014 99.2
X Ray Diffraction 2.7 3.4 4876 244 4632 0.183 0.204 0.013 99.4
X Ray Diffraction 3.4 31.45 5052 263 4789 0.183 0.195 0.012 99.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model restrained
Mean Isotropic B 26.09
Anisotropic B[1][1] 0.55
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.36
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.2
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 0.68
x_torsion_deg 22.4
x_angle_deg 1.4
x_bond_d 0.005
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.18
Luzzati Sigma A (Observed) 0.18
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.21
Luzzati Sigma A (R-Free Set) 0.23
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2254
Nucleic Acid Atoms 0
Heterogen Atoms 11
Solvent Atoms 489

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SOLVE, AUTOSHARP Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement