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X-RAY DIFFRACTION
Materials and Methods page
1NQJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 277.0
    Details PEG 3350, LITHIUM CHLORIDE, SODIUM ACETATE, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.64 α = 90
    b = 57.71 β = 95.69
    c = 46.32 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2000-06-01
     
    Diffraction Radiation
    Monochromator SI (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 17-ID
    Wavelength 1.0000
    Wavelength List 1.0000
    Site APS
    Beamline 17-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 0.98
    Resolution(Low) 36
    Number Reflections(All) 114718
    Number Reflections(Observed) 105185
    Percent Possible(Observed) 91.7
    Redundancy 3.01
     
    High Resolution Shell Details
    Resolution(High) 1.0
    Resolution(Low) 1.07
    Percent Possible(All) 72.64
    Mean I Over Sigma(Observed) 2.94
    R-Sym I(Observed) 0.318
    Number Unique Reflections(All) 15310
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 1.0
    Resolution(Low) 28.85
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 86824
    Number of Reflections(Observed) 86824
    Number of Reflections(R-Free) 10518
    Percent Reflections(Observed) 91.7
    R-Factor(All) 0.1416
    R-Factor(Observed) 0.1416
    R-Work 0.1398
    R-Free 0.1677
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0
    Shell Resolution(Low) 1.07
    Number of Reflections(Observed) 15310
    Percent Reflections(Observed) 72.64
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.07
    Shell Resolution(Low) 1.2
    Number of Reflections(Observed) 23987
    Percent Reflections(Observed) 88.46
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2
    Shell Resolution(Low) 1.5
    Number of Reflections(Observed) 32076
    Percent Reflections(Observed) 99.12
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 2.0
    Number of Reflections(Observed) 19604
    Percent Reflections(Observed) 99.77
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 8.0
    Number of Reflections(Observed) 13990
    Percent Reflections(Observed) 98.01
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.0
    Shell Resolution(Low) 36.0
    Number of Reflections(Observed) 218
    Percent Reflections(Observed) 88.62
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    s_approx_iso_adps 0.06
    s_similar_adp_cmpnt 0.044
    s_rigid_bond_adp_cmpnt 0.005
    s_anti_bump_dis_restr 0.044
    s_non_zero_chiral_vol 0.098
    s_zero_chiral_vol 0.082
    s_from_restr_planes 0.0296
    s_similar_dist 0.0
    s_angle_d 0.035
    s_bond_d 0.015
     
    Coordinate Error
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1709
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 388
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) SAINT
    Data Reduction (data scaling) SAINT
    Structure Solution CNS
    Structure Refinement SHELXL-97
     
    Software
    refinement SHELXL-97
    model building SHELX
    data reduction SAINT
    data collection SAINT