X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.6
Temperature 277.0
Details PEG 3350, LITHIUM CHLORIDE, SODIUM ACETATE, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.64 α = 90
b = 57.71 β = 95.69
c = 46.32 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2000-06-01
Diffraction Radiation
Monochromator Protocol
SI (111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0000 APS 17-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.98 36 91.7 -- 0.075 -- 3.01 114718 105185 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.0 1.07 72.64 -- 0.318 2.94 -- 15310

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.0 28.85 -- 0.0 86824 86824 10518 91.7 0.1416 0.1416 0.1398 0.1677 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.0 1.07 15310 -- -- -- -- -- 72.64
X Ray Diffraction 1.07 1.2 23987 -- -- -- -- -- 88.46
X Ray Diffraction 1.2 1.5 32076 -- -- -- -- -- 99.12
X Ray Diffraction 1.5 2.0 19604 -- -- -- -- -- 99.77
X Ray Diffraction 2.0 8.0 13990 -- -- -- -- -- 98.01
X Ray Diffraction 8.0 36.0 218 -- -- -- -- -- 88.62
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.06
s_similar_adp_cmpnt 0.044
s_rigid_bond_adp_cmpnt 0.005
s_anti_bump_dis_restr 0.044
s_non_zero_chiral_vol 0.098
s_zero_chiral_vol 0.082
s_from_restr_planes 0.0296
s_similar_dist 0.0
s_angle_d 0.035
s_bond_d 0.015
Coordinate Error
Parameter Value
Number Disordered Residues 40.0
Occupancy Sum Hydrogen 1650.0
Occupancy Sum Non Hydrogen 2066.53
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1709
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 388

Software

Computing
Computing Package Purpose
SAINT Data Reduction (intensity integration)
SAINT Data Reduction (data scaling)
CNS Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
SAINT data reduction
SAINT data collection