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X-RAY DIFFRACTION
Materials and Methods page
1NQD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 277.0
    Details PEG 3350, lithium chloride, sodium acetate, glycerol, calcium nitrate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.87 α = 90
    b = 59.4 β = 98.73
    c = 48.57 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type BRANDEIS
    Collection Date 2000-10-01
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength 0.97950
    Wavelength List 0.97950
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.65
    Resolution(Low) 8
    Number Reflections(All) 27831
    Number Reflections(Observed) 27436
    Percent Possible(Observed) 98.6
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.71
    Percent Possible(All) 90.9
    Mean I Over Sigma(Observed) 4.36
    R-Sym I(Observed) 0.248
    Redundancy 3.3
    Number Unique Reflections(All) 2526
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.65
    Resolution(Low) 8.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27152
    Number of Reflections(Observed) 27152
    Number of Reflections(R-Free) 2715
    Percent Reflections(Observed) 98.8
    R-Factor(All) 0.1908
    R-Factor(Observed) 0.1908
    R-Work 0.1852
    R-Free 0.2543
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.65
    Shell Resolution(Low) 1.7
    Number of Reflections(Observed) 2175
    Percent Reflections(Observed) 90.66
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.8
    Number of Reflections(Observed) 3922
    Percent Reflections(Observed) 99.09
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 2.0
    Number of Reflections(Observed) 5731
    Percent Reflections(Observed) 99.69
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.5
    Number of Reflections(Observed) 7580
    Percent Reflections(Observed) 99.95
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 3.3
    Number of Reflections(Observed) 4523
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3
    Shell Resolution(Low) 8.0
    Number of Reflections(Observed) 3221
    Percent Reflections(Observed) 90.94
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    s_approx_iso_adps 0.0
    s_similar_adp_cmpnt 0.069
    s_rigid_bond_adp_cmpnt 0.0
    s_anti_bump_dis_restr 0.0
    s_non_zero_chiral_vol 0.056
    s_zero_chiral_vol 0.038
    s_from_restr_planes 0.0268
    s_similar_dist 0.0
    s_angle_d 0.024
    s_bond_d 0.007
     
    Coordinate Error
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1821
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 313
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement SHELXL-97
     
    Software
    refinement SHELXL-97
    model building SHELX
    model building CNS
    data reduction HKL2000
    data collection HKL2000