X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.6
Temperature 277.0
Details PEG 3350, lithium chloride, sodium acetate, glycerol, calcium nitrate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.87 α = 90
b = 59.4 β = 98.73
c = 48.57 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD BRANDEIS -- 2000-10-01
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.97950 NSLS X25

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 8 98.6 -- 0.058 -- 4.2 27831 27436 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.65 1.71 90.9 -- 0.248 4.36 3.3 2526

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.65 8.0 -- 0.0 27152 27152 2715 98.8 0.1908 0.1908 0.1852 0.2543 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.65 1.7 2175 -- -- -- -- -- 90.66
X Ray Diffraction 1.7 1.8 3922 -- -- -- -- -- 99.09
X Ray Diffraction 1.8 2.0 5731 -- -- -- -- -- 99.69
X Ray Diffraction 2.0 2.5 7580 -- -- -- -- -- 99.95
X Ray Diffraction 2.5 3.3 4523 -- -- -- -- -- 100.0
X Ray Diffraction 3.3 8.0 3221 -- -- -- -- -- 90.94
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.0
s_similar_adp_cmpnt 0.069
s_rigid_bond_adp_cmpnt 0.0
s_anti_bump_dis_restr 0.0
s_non_zero_chiral_vol 0.056
s_zero_chiral_vol 0.038
s_from_restr_planes 0.0268
s_similar_dist 0.0
s_angle_d 0.024
s_bond_d 0.007
Coordinate Error
Parameter Value
Number Disordered Residues 18.0
Occupancy Sum Hydrogen 0.0
Occupancy Sum Non Hydrogen 2119.5
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1821
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 313

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
CNS Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
CNS model building
HKL2000 data reduction
HKL2000 data collection