X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 128.5 α = 90
b = 128.5 β = 90
c = 116.3 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS -- 1993
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- -- 0.068 -- -- 2.2 -- n/a -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.4 8.0 -- -- -- 36005 -- -- -- 0.193 0.193 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 26.6
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 2.0
x_scbond_it 1.5
x_mcangle_it 2.0
x_mcbond_it 1.5
x_bond_d 0.017
x_angle_deg 3.2
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6759
Nucleic Acid Atoms 0
Heterogen Atoms 29
Solvent Atoms 442

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building