X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 298.0
Details PEG2000 MME, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.87 α = 84.22
b = 44.42 β = 77.04
c = 57.86 γ = 89.39
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-D -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 28.94 -- -- -- -- -- 44964 44964 0.0 -- 15.9

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 19.88 -- -- 49422 44654 2236 90.4 -- -- 0.207 0.233 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6 1.67 4820 249 4571 0.297 0.32 0.02 77.9
X Ray Diffraction 1.67 1.76 5359 274 5085 0.225 0.255 0.015 86.1
X Ray Diffraction 1.76 1.87 5477 272 5205 0.205 0.248 0.015 88.6
X Ray Diffraction 1.87 2.02 5573 270 5303 0.197 0.242 0.015 90.4
X Ray Diffraction 2.02 2.22 5724 274 5450 0.2 0.227 0.014 92.4
X Ray Diffraction 2.22 2.54 5788 282 5506 0.213 0.239 0.014 94.0
X Ray Diffraction 2.54 3.2 5929 301 5628 0.213 0.238 0.014 95.8
X Ray Diffraction 3.2 19.88 5984 314 5670 0.19 0.209 0.012 97.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 14.77
Anisotropic B[1][1] 0.42
Anisotropic B[1][2] -1.56
Anisotropic B[1][3] 0.27
Anisotropic B[2][2] 0.45
Anisotropic B[2][3] 0.49
Anisotropic B[3][3] -0.87
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 0.82
x_torsion_deg 26.8
x_angle_deg 1.4
x_bond_d 0.005
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.18
Luzzati Sigma A (Observed) 0.03
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.2
Luzzati Sigma A (R-Free Set) 0.09
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3291
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 462

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
EPMR Structure Solution
CNS 1.0 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement