X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.26
Temperature 289.0
Details PEG 2000 monomethyl ether, ammonium sulfate, ethylene glycol, sodium citrate, pH 5.26, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 48.58 α = 90
b = 48.58 β = 90
c = 146.57 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
3 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV -- 2000-10-16
CCD BRANDEIS - B2 -- 2000-11-05
CCD ADSC QUANTUM 4 -- 2001-02-08
Diffraction Radiation
Monochromator Protocol
NSLS X12C optics MAD
Osmic mirror SINGLE WAVELENGTH
NSLS X26C optics SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.9789, 0.97865, 0.95 NSLS X12C
ROTATING ANODE RIGAKU RU300 1.5418 -- --
SYNCHROTRON NSLS BEAMLINE X26C 1.1 NSLS X26C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 20 99.5 0.046 -- -- 8.73 12345 12345 -- -3.0 22.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.14 99.8 0.098 -- -- -- 585

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.1 19.33 -- 2.0 11028 11028 894 99.5 -- -- 0.213 0.263 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.18 12345 1788 -- 0.285 0.287 0.021 94.1
X Ray Diffraction 2.18 -- 2125 180 -- -- -- -- 80.8
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 26.8
Anisotropic B[1][1] 2.09
Anisotropic B[1][2] 1.87
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.09
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -4.18
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 0.65
x_angle_d 1.4
x_dihedral_angle_d 24.2
x_bond_d 0.007
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.24
Luzzati Sigma A (Observed) 0.21
Luzzati Resolution Cutoff (Low) 19.33
Luzzati ESD (R-Free Set) 0.3
Luzzati Sigma A (R-Free Set) 0.19
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1214
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 92

Software

Software
Software Name Purpose
R-AXIS data collection
SCALEPACK data scaling
SOLVE phasing
X-PLOR refinement version: 3.851
R-AXIS data reduction