X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 277.0
Details PEG4000, NaAC, Tris-HCl, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.69 α = 90
b = 63.01 β = 90
c = 58.61 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 1999-01-01
Diffraction Radiation
Monochromator Protocol
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 0.96110, 0.98000, 0.98019 NSLS X9B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 19.83 95.5 -- -- -- -- 5843 5843 0.0 0.0 31.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.8 90.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.7 19.83 -- 2.0 -- 5842 629 95.6 0.258 0.252 0.214 0.278 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.8 544 53 491 0.237 0.236 0.032 90.8
X Ray Diffraction 2.8 2.91 546 70 476 0.236 0.234 0.028 91.8
X Ray Diffraction 2.91 3.04 557 71 486 0.243 0.239 0.028 93.3
X Ray Diffraction 3.04 3.2 574 65 509 0.221 0.219 0.027 96.0
X Ray Diffraction 3.2 3.4 582 52 530 0.23 0.229 0.032 96.4
X Ray Diffraction 3.4 3.66 588 71 517 0.219 0.224 0.027 96.7
X Ray Diffraction 3.66 4.03 587 65 522 0.213 0.218 0.027 97.2
X Ray Diffraction 4.03 4.6 605 58 547 0.185 0.193 0.025 98.4
X Ray Diffraction 4.6 5.77 618 59 559 0.21 0.204 0.027 97.0
X Ray Diffraction 5.77 19.83 641 65 576 0.203 0.2 0.025 96.5
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 21.94
Anisotropic B[1][1] 9.98
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.55
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -6.43
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 3.67
x_scbond_it 2.55
x_mcangle_it 2.55
x_mcbond_it 1.53
x_torsion_impr_deg 0.63
x_torsion_deg 26.8
x_angle_deg 1.4
x_bond_d 0.008
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.3
Luzzati Sigma A (Observed) 0.27
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.41
Luzzati Sigma A (R-Free Set) 0.42
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1804
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SOLVE Structure Solution
CNS 1.0 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.0 refinement