X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 0.1M Na HEPES, 2M Ammonium sulphate, 2% PEG 400, 2 mM 4-(hydroxymercuri)benzoic acid, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.99 α = 90
b = 89.56 β = 90
c = 122.29 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2002-08-14
Diffraction Radiation
Monochromator Protocol
Double crystal focussing monochromator MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7A 1.005231, 1.00870, 0.93200 EMBL/DESY, HAMBURG BW7A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 37.5 97.2 0.091 0.091 -- 9.7 65739 65739 0.0 0.0 18.95
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.79 96.3 0.619 0.619 1.1 9.6 9337

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.7 19.96 0.0 0.0 -- 50036 5522 97.6 0.20702 0.20702 0.2025 0.2554 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.79 9337 784 4348 0.252 0.316 -- 96.3
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 20.738
Anisotropic B[1][1] 0.01
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.01
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.02
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.686
r_scbond_it 3.112
r_mcangle_it 1.934
r_mcbond_it 1.159
r_symmetry_vdw_refined 0.4
r_nbd_refined 0.311
r_gen_planes_refined 0.009
r_chiral_restr 0.155
r_dihedral_angle_1_deg 7.22
r_angle_refined_deg 1.994
r_bond_refined_d 0.02
Coordinate Error
Parameter Value
Luzzati Sigma A (Observed) 0.055714
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4831
Nucleic Acid Atoms 0
Heterogen Atoms 108
Solvent Atoms 343

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
SOLVE/RESOLVE Structure Solution
REFMAC 5.1.80 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.1.80 refinement
SOLVE_RESOLVE model building
SCALA data reduction
MOSFLM data collection