X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Microbatch
pH 8.5
Temperature 292.0
Details PEG 4000, MAGNESIUM CHLORIDE,Tris-HCl pH 8.5, MICROBATCH, temperature 292K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 78.1 α = 90
b = 78.1 β = 90
c = 223.18 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD CUSTOM-MADE mirrors 1999-06-20
CCD CUSTOM-MADE mirrors 1999-06-20
Diffraction Radiation
Monochromator Protocol
double crystal monochromator Si-111 and double crystal monochromator Si-220 MAD
double crystal monochromator Si-111 and double crystal monochromator Si-220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794, 0.9792, 0.9421, 1.0197 APS 19-ID
SYNCHROTRON APS BEAMLINE 19-ID 1.033 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 30 95.0 -- -- -- -- -- 39261 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.18 85.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.1 30.0 -- 2.0 39261 36311 3636 -- 0.1921 0.1853 0.1853 0.2306 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.18 -- 321 -- 0.1784 0.2336 -- --
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.26531
c_improper_angle_d 0.76241
c_dihedral_angle_d 21.5519
c_bond_d 0.004888
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5368
Nucleic Acid Atoms 0
Heterogen Atoms 6
Solvent Atoms 450

Software

Software
Software Name Purpose
HKL-2000 data collection
SCALEPACK data scaling
SOLVE phasing
CNS refinement
HKL-2000 data reduction