X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.3
Temperature 298.0
Details acetate buffer pH 5.3, 1,2-hexanediol, 0.5 mM CaCl2, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 185.29 α = 90
b = 185.29 β = 90
c = 85.19 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 -- --
CCD ADSC QUANTUM 4 -- 2001-12-20
Diffraction Radiation
Monochromator Protocol
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID -- APS 19-ID
SYNCHROTRON ALS BEAMLINE 8.2.1 -- ALS 8.2.1
SYNCHROTRON ALS BEAMLINE 5.0.2 1.21363, 1.21423, 1.10696, 1.23985 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.7 45.3 95.6 0.09 -- -- 3.7 -- 17303 0.0 0.0 74.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.7 3.83 64.5 0.449 -- 2.7 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 3.7 45.3 -- 0.0 17303 16008 1119 87.8 -- -- 0.381 0.382 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.7 3.87 -- 68 757 0.455 0.512 0.062 36.7
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model OVERALL
Mean Isotropic B 124.7
Anisotropic B[1][1] 20.49
Anisotropic B[1][2] 9.97
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 20.49
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -40.98
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 2.52
c_dihedral_angle_d 26.7
c_angle_deg 4.9
c_bond_d 0.031
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 1.1
Luzzati Sigma A (Observed) 1.05
Luzzati Resolution Cutoff (Low) 50.0
Luzzati ESD (R-Free Set) 1.19
Luzzati Sigma A (R-Free Set) 1.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4702
Nucleic Acid Atoms 0
Heterogen Atoms 254
Solvent Atoms 0

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
SHARP Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
CNS version: 1.1 refinement
SHARP model building
SCALA data reduction
MOSFLM data collection