X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.2
Details pH 7.2

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 165.53 α = 90
b = 89.85 β = 90
c = 112.55 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 1998-05
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-3 -- ESRF ID14-3

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 40 99.0 -- 0.067 -- 4.8 -- 43791 -- 2.0 53.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.75 2.82 98.0 -- 0.345 2.1 4.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.9 12.0 -- 1.0 -- 36956 1303 98.98 -- 0.208 0.208 0.246 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.9 3.03 -- 83 4450 0.2682 0.3047 0.033 98.68
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 34.16
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.517
x_bond_d 0.006
x_angle_deg 1.75
x_dihedral_angle_d 25.18
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.43
Luzzati Resolution Cutoff (Low) 12.0
Luzzati ESD (R-Free Set) 0.515
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8417
Nucleic Acid Atoms 0
Heterogen Atoms 184
Solvent Atoms 0

Software

Computing
Computing Package Purpose
DENZO, PROW Data Reduction (intensity integration)
CCP4 Data Reduction (data scaling)
X-PLOR 3.8 Structure Solution
X-PLOR 3.8 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.8 refinement
X-PLOR version: 3.8 model building