X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.6
Temperature 291.0
Details glycerol, DTT, Hepes, NaCl, EtOH, EDTA, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 120.32 α = 90
b = 120.32 β = 90
c = 132.2 γ = 120
Symmetry
Space Group P 3 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 undulator A 2001-06-20
Diffraction Radiation
Monochromator Protocol
Si 220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.074385 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 30 98.4 0.125 -- -- 6.2 28059 27610 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.9 99.2 0.544 0.544 3.9 5.4 2776

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.8 30.0 0.0 0.0 27715 26688 1333 96.3 -- -- 0.243 0.276 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8 2.84 970 49 921 0.367 0.392 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model anisotropic
Mean Isotropic B 30.79
Anisotropic B[1][1] 13.866
Anisotropic B[1][2] 3.912
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 13.866
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -27.732
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 7.546
c_scbond_it 4.926
c_mcangle_it 4.57
c_mcbond_it 2.953
c_dihedral_angle_d 21.54
c_improper_angle_d 0.799
c_bond_d 0.009
c_angle_deg 1.374
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.3974
Luzzati Sigma A (Observed) 0.573
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.4675
Luzzati Sigma A (R-Free Set) 0.6238
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5866
Nucleic Acid Atoms 0
Heterogen Atoms 2
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
CCP4 (TRUNCATE) Data Reduction (data scaling)
SOLVE Structure Solution
CNS Structure Refinement
Software
Software Name Purpose
CNS refinement
solve model building
TRUNCATE data reduction
HKL-2000 data collection