ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Aggregation State FILAMENT
EM Data Acquisition
Date of Experiment --
Num of Micrographs-Images Used --
Temperature (Kelvin) --
Microscope Model TECNAI 12
Detector Type --
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS --
Imaging Mode --
Electron Dose (electrons nm**-2) --
Illumination Mode --
Nominal Magnification --
Calibrated Magnification --
Source --
Acceleration Voltage (kV) 120
Imaging Details --
3D Reconstruction
Software Package(s)
Reconstruction Method Iterative Helical Real Space Reconstruction method (Egelman, Ultramicroscopy 85, 225-234, 2000) was used.
EM Image Reconstruction Statistics
Number of Particles 60000
Nominal Pixel Size 3.9
Actual Pixel Size 3.9
Effective Resolution 20.0
EM Reconstruction Magnification Callibration TMV PARTICLES
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL rigid body best visual fit using the program O -- -- O