X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.5
Temperature 294.0
Details 50% MPD, 0.1M NACACODYLATE, 0.2M NAGLUTAMATE, pH 5.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 115.15 α = 90
b = 115.15 β = 90
c = 124.42 γ = 90
Symmetry
Space Group I 41 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 MIRROR 2002-07-07
Diffraction Radiation
Monochromator Protocol
CRYOGENICALLY-COOLED SI(111) DOUBLE-CRYSTAL SYSTEM SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.97240 APS 17-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.08 19.83 98.3 0.048 -- -- 14.9 -- 24983 0.0 0.0 29.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.08 2.15 89.6 0.305 -- 8.96 -- 24986

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.08 19.83 -- 0.0 -- 24578 1194 99.0 -- -- 0.198 0.269 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.08 2.17 2703 117 2586 0.299 0.423 -- 89.6
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 32.6
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.9
c_bond_d 0.021
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2924
Nucleic Acid Atoms 0
Heterogen Atoms 11
Solvent Atoms 356

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
EPMR, RESOLVE Structure Solution
CNS Structure Refinement
Software
Software Name Purpose
CNS refinement
RESOLVE model building
EPMR model building
HKL2000 data reduction
HKL2000 data collection