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ELECTRON MICROSCOPY
Materials and Methods page
1MVR
  •   EM Refinement Details Hide
    3D Reconstruction
    Reconstruction Method Reference Bases Alignment
     
    EM Map-Model Fitting & Refinement
    Refinement Space REAL
    Fitting Procedure Manual
     
    EM Image Reconstruction Statistics
    Actual Pixel Size 2.82
    Effective Resolution 12.8
    CTF Correction Method Wiener filtering of 3D-maps
    EM Reconstruction Magnification Callibration TMV
    Other Details SPIDER package
     
    Electron Microscope Sample
    Sample Concentration (mg/ml) 32.0
    Sample pH 7.5
    Sample Vitrification Details Rapid-freezing in liquid ethane
    Sample Aggregation State PARTICLE
     
    Data Acquisition
    Date of Experiment 2001-11-08
    Temperature (Kelvin) 93.0
    Microscope Model FEI TECNAI F20
    Detector Type KODAK SO163 FILM
    Minimum Defocus (NM) 2020.0
    Maximum Defocus (NM) 4500.0
    Minimum Tilt Angle (degrees) 0.0
    Maximum Tilt Angle (degrees) 0.0
    Nominal CS 2.0
    Imaging Mode BRIGHT FIELD
    Electron Dose (electrons nm**-2) 2000.0
    Illumination Mode FLOOD BEAM
    Nominal Magnification 50000
    Calibrated Magnification 49696
    Source FIELD EMISSION GUN
    Acceleration Voltage (KV) 200