X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 290.0
Details Sodium Formate 2.7M, VAPOR DIFFUSION, HANGING DROP, temperature 290K
Method Vapor Diffusion Hanging Drop
Temperature 290.0
Details Sodium Formate 2.7M, VAPOR DIFFUSION, HANGING DROP, temperature 290K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 181.39 α = 90
b = 183 β = 90
c = 184.12 γ = 90
Symmetry
Space Group F 2 2 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 Mirrors 2001-04-10
CCD MARRESEARCH Mirrors 2000-11-10
Diffraction Radiation
Monochromator Protocol
Si 111 channel SINGLE WAVELENGTH
Si 111 channel MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX14.2 0.97800 SRS PX14.2
SYNCHROTRON ESRF BEAMLINE BM14 0.97947, 0.97939, 0.96863 ESRF BM14

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 20 -- 0.053 -- -- 3.37 -- 140296 -- -- 39.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.84 -- 0.438 -- 3.27 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.8 21.22 -- 0.0 -- 129459 6864 97.26 0.17792 0.17792 0.17636 0.20687 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.846 -- 481 8928 0.225 0.266 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 17.225
Anisotropic B[1][1] -0.06
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.05
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.01
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 8.608
r_scbond_it 6.804
r_mcangle_it 4.601
r_mcbond_it 3.304
r_symmetry_hbond_refined 0.202
r_symmetry_vdw_other 0.191
r_symmetry_vdw_refined 0.155
r_xyhbond_nbd_other 0.236
r_bond_refined_d 0.012
r_bond_other_d 0.0
r_angle_refined_deg 1.244
r_angle_other_deg 0.744
r_dihedral_angle_1_deg 8.048
r_dihedral_angle_2_deg 20.394
r_chiral_restr 0.108
r_gen_planes_refined 0.013
r_gen_planes_other 0.007
r_nbd_refined 0.224
r_nbd_other 0.203
r_xyhbond_nbd_refined 0.154
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9523
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 694

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SHELXD Structure Solution
REFMAC 5 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.0 refinement
SHELXD model building
SCALEPACK data reduction
DENZO data collection