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X-RAY DIFFRACTION
Materials and Methods page
1MLC
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 99.7 α = 90
    b = 167.3 β = 90
    c = 84.7 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector AREA DETECTOR
    Type SIEMENS
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Number Reflections(Observed) 44729
    Percent Possible(Observed) 94.0
    R Merge I(Observed) 0.1
    Redundancy 4.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.5
    Resolution(Low) 7.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 42713
    R-Factor(Observed) 0.184
    R-Free 0.282
     
    Temperature Factor Modeling
    Mean Isotropic B Value 27.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    p_orthonormal_tor 20.1
    p_staggered_tor 23.1
    p_planar_tor 5.4
    p_xhyhbond_nbd 0.23
    p_multtor_nbd 0.27
    p_bond_d 0.016
    p_angle_d 0.041
    p_planar_d 0.051
    p_mcbond_it 0.86
    p_mcangle_it 1.56
    p_scbond_it 1.27
    p_scangle_it 2.04
    p_plane_restr 0.01
    p_chiral_restr 167.0
    p_singtor_nbd 0.22
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8582
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 210
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Structure Refinement PROLSQ
     
    Software
    refinement PROLSQ
    data collection XDS