X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 277.0
Details 2-Methyl-2,4-Pentanediol (MPD), tris-phosphate, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 106.77 α = 90
b = 75.53 β = 90
c = 51.03 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 116
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV Mirrors 2000-08-06
Diffraction Radiation
Monochromator Protocol
Graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.54178 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 50 11.56 0.055 -- -- 8.645 -- 50278 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.65 1.68 0.0055 0.5 -- 2.275 4.8 2419

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.65 50.0 0.0 0.0 50429 48421 2419 96.0 -- -- 0.1798 0.1982 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.65 1.71 4113 235 -- 0.4174 0.4155 -- 8.4
X Ray Diffraction 1.71 1.78 4340 215 -- 0.296 0.3079 -- 8.96
X Ray Diffraction 1.78 1.86 4467 208 -- 0.2187 0.208 -- 9.22
X Ray Diffraction 1.86 1.96 4572 212 -- 0.1874 0.2053 -- 9.44
X Ray Diffraction 1.96 2.08 4588 261 -- 0.1793 0.1876 -- 9.47
X Ray Diffraction 2.08 2.24 4691 249 -- 0.1759 0.2083 -- 9.68
X Ray Diffraction 2.24 2.46 4703 262 -- 0.1756 0.1822 -- 9.71
X Ray Diffraction 2.46 2.82 4786 245 -- 0.1654 0.212 -- 9.88
X Ray Diffraction 2.82 3.55 4817 256 -- 0.1573 0.168 -- 9.94
X Ray Diffraction 3.55 50.0 4925 276 -- 0.1556 0.1772 -- 10.17
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
RMS Deviations
Key Refinement Restraint Deviation
o_bond_d 0.0049
c_angle_d 2.2416
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.19
Luzzati Sigma A (Observed) 0.02
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.21
Luzzati Sigma A (R-Free Set) 0.18
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2376
Nucleic Acid Atoms 0
Heterogen Atoms 43
Solvent Atoms 603

Software

Software
Software Name Purpose
DENZO data reduction
SCALEPACK data scaling
CNS refinement
CNS phasing