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X-RAY DIFFRACTION
Materials and Methods page
1MFR
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.5
    Details pH 4.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 210.8 α = 90
    b = 210.8 β = 90
    c = 328.1 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 300
     
    Diffraction Detector
    Detector CCD
    Type BRANDEIS
    Collection Date 1998-02
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X12C
    Wavelength 1.1
    Site NSLS
    Beamline X12C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.8
    Resolution(Low) 10
    Number Reflections(Observed) 141403
    Percent Possible(Observed) 70.0
    R Merge I(Observed) 0.064
    Redundancy 1.8
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.92
    Percent Possible(All) 27.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 10.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 141403
    Percent Reflections(Observed) 70.0
    R-Factor(Observed) 0.19
    R-Work 0.19
    R-Free 0.194
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.01
    x_angle_deg 2.375
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 32952
    Nucleic Acid Atoms 0
    Heterogen Atoms 48
    Solvent Atoms 1320
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR