X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.8
Temperature 293.0
Details pH 7.80, VAPOR DIFFUSION, HANGING DROP, temperature 293.00K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.07 α = 90
b = 165.53 β = 90
c = 46.27 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 84.0 0.088 -- -- 6.0 -- 23392 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 6.0 -- 3.0 -- 19237 -- -- -- 0.224 0.224 0.319 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.22 -- -- 350 0.347 0.32 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 32.1
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 1.77
x_improper_angle_d 1.86
x_bond_d 0.014
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1579
Nucleic Acid Atoms 1054
Heterogen Atoms 11
Solvent Atoms 132

Software

Software
Software Name Purpose
X-PLOR refinement
PROCESS data reduction
PROCESS data scaling