X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 277.0
Details dihydro-nicotinamide-adenine-dinucleotide phosphate (NADPH), 5-(4-METHOXYPHENOXY)-2,4-QUINAZOLINEDIAMINE (GW1466), PEG-3350, Potassium 4-morphilineethanesulfonic acid (MES), dithiothreitol (DTT), pH 6.50, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.09 α = 90
b = 67.03 β = 93.3
c = 38.5 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR XENTRONICS MONOCHROMATOR 1989-03-16
Diffraction Radiation
Monochromator Protocol
HUBER GRAPHITE MONOCHROMATOR SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ELLIOTT GX-21 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 83.45 0.0644 0.0644 -- 2.45 -- 36008 0.0 -3.0 33.74
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.8 99.9 0.1978 0.1978 3.7 1.79 2562

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
DIRECT REPLACEMENT 1.7 10.0 0.0 2.0 36010 33900 -- 83.45 -- -- 0.145 -- --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.8 1843 -- -- 0.157 -- -- --
X Ray Diffraction 1.8 1.93 4451 -- -- 0.15 -- -- --
X Ray Diffraction 1.93 2.1 5631 -- -- 0.143 -- -- --
X Ray Diffraction 2.1 2.3 5269 -- -- 0.14 -- -- --
X Ray Diffraction 2.3 2.64 5713 -- -- 0.149 -- -- --
X Ray Diffraction 2.64 3.3 5469 -- -- 0.144 -- -- --
X Ray Diffraction 3.3 10.0 5524 -- -- 0.145 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Konnert, J.H. & Hendrickson, W.A. (1980) Acta Crystallogr. A A34, 344.
RMS Deviations
Key Refinement Restraint Deviation
p_transverse_tor 32.2
p_staggered_tor 14.4
p_planar_tor 3.9
p_xyhbond_nbd 0.137
p_bond_d 0.02
p_angle_d 0.031
p_planar_d 0.038
p_mcbond_it 4.601
p_mcangle_it 5.461
p_scbond_it 6.817
p_scangle_it 8.323
p_plane_restr 0.02
p_chiral_restr 0.245
p_singtor_nbd 0.164
p_multtor_nbd 0.147
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3119
Nucleic Acid Atoms 0
Heterogen Atoms 162
Solvent Atoms 354

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (data scaling)
FRODO Structure Solution
PROFFT Structure Refinement
Software
Software Name Purpose
PROFFT refinement
FRODO model building
XENGEN data reduction