X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 277.0
Details dihydro-nicotinamide-adenine-dinucleotide phosphate (NADPH), 5-(4-METHOXYPHENOXY)-2,4-QUINAZOLINEDIAMINE (GW1466), PEG-3350, Potassium 4-morphilineethanesulfonic acid (MES), dithiothreitol (DTT), pH 6.50, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.09 α = 90
b = 67.03 β = 93.3
c = 38.5 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR XENTRONICS MONOCHROMATOR 1989-03-16
Diffraction Radiation
Monochromator Protocol
HUBER GRAPHITE MONOCHROMATOR SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ELLIOTT GX-21 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 83.45 0.0644 0.0644 -- 2.45 -- 36008 0.0 -3.0 33.74
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.8 99.9 0.1978 0.1978 3.7 1.79 2562

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
DIRECT REPLACEMENT 1.7 10.0 0.0 2.0 36010 33900 -- 83.45 -- -- 0.145 -- --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.8 1843 -- -- 0.157 -- -- --
X Ray Diffraction 1.8 1.93 4451 -- -- 0.15 -- -- --
X Ray Diffraction 1.93 2.1 5631 -- -- 0.143 -- -- --
X Ray Diffraction 2.1 2.3 5269 -- -- 0.14 -- -- --
X Ray Diffraction 2.3 2.64 5713 -- -- 0.149 -- -- --
X Ray Diffraction 2.64 3.3 5469 -- -- 0.144 -- -- --
X Ray Diffraction 3.3 10.0 5524 -- -- 0.145 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Konnert, J.H. & Hendrickson, W.A. (1980) Acta Crystallogr. A A34, 344.
RMS Deviations
Key Refinement Restraint Deviation
p_staggered_tor 14.4
p_xyhbond_nbd 0.137
p_chiral_restr 0.245
p_planar_tor 3.9
p_mcbond_it 4.601
p_plane_restr 0.02
p_scbond_it 6.817
p_transverse_tor 32.2
p_multtor_nbd 0.147
p_bond_d 0.02
p_angle_d 0.031
p_scangle_it 8.323
p_mcangle_it 5.461
p_singtor_nbd 0.164
p_planar_d 0.038
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3193
Nucleic Acid Atoms 0
Heterogen Atoms 162
Solvent Atoms 367

Software

Software
Software Name Purpose
XENGEN data reduction
FRODO model building
PROFFT refinement
XENGEN data scaling