X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Liquid Diffusion
pH 7.5
Temperature 277.0
Details dihydro-nicotinamide-adenine-dinucleotide phosphate (NADPH), 5-chloryl-2,4,6-quinazolinetriamine (GW1225), PEG-3350, Potassium 4-morphilineethanesulfonic acid (MES), dithiothreitol (DTT), pH 7.50, LIQUID DIFFUSION, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 76.91 α = 90
b = 67.28 β = 93.07
c = 38.49 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR XENTRONICS Huber graphite MONOCHROMATOR 1988-03-29
Diffraction Radiation
Monochromator Protocol
HUBER GRAPHITE MONOCHROMATOR SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ELLIOTT GX-21 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.71 50 91.5 0.0537 0.0537 -- 3.118 -- 37244 0.0 -3.0 34.35
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.71 1.81 60.55 0.2337 0.2337 2.1 1.83 4052

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
DIRECT REPLACEMENT 1.71 10.0 -3.0 2.0 37249 32743 -- 91.5 0.1557 0.1557 0.1557 -- --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.71 1.85 2794 -- -- 0.203 -- -- --
X Ray Diffraction 1.85 2.0 5131 -- -- 0.171 -- -- --
X Ray Diffraction 2.0 2.25 6930 -- -- 0.159 -- -- --
X Ray Diffraction 2.25 2.7 7409 -- -- 0.159 -- -- --
X Ray Diffraction 2.7 3.4 5266 -- -- 0.147 -- -- --
X Ray Diffraction 3.4 10.0 5213 -- -- 0.147 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Konnert, J.H. & Hendrickson, W.A. (1980) Acta Crystallogr. A A36, 344.
RMS Deviations
Key Refinement Restraint Deviation
p_plane_restr 0.019
p_scbond_it 6.119
p_singtor_nbd 0.164
p_bond_d 0.02
p_angle_d 0.031
p_chiral_restr 0.247
p_planar_tor 3.7
p_staggered_tor 14.7
p_mcangle_it 5.207
p_multtor_nbd 0.145
p_mcbond_it 4.628
p_scangle_it 7.612
p_xyhbond_nbd 0.145
p_transverse_tor 30.8
p_planar_d 0.036
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3182
Nucleic Acid Atoms 0
Heterogen Atoms 124
Solvent Atoms 348

Software

Software
Software Name Purpose
X-GEN data reduction
FRODO model building
PROFFT refinement
X-GEN data scaling